학술논문

Bayesian tomographic reconstruction for high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM)
Document Type
Conference
Source
2012 IEEE Statistical Signal Processing Workshop (SSP) Statistical Signal Processing Workshop (SSP), 2012 IEEE. :680-683 Aug, 2012
Subject
Signal Processing and Analysis
Components, Circuits, Devices and Systems
Signal processing
Conferences
Image reconstruction
Abstracts
Nickel
Estimation
Electron tomography
dark-field
Bayesian
methods
Language
ISSN
2373-0803
Abstract
HAADF-STEM data is increasingly being used in the physical sciences to study materials in 3D because it is free from the diffraction effects seen in Bright Field STEM data and satisfies the projection requirement for tomography. Typically, reconstruction is performed using Filtered Back Projection (FBP) or the SIRT algorithm. In this paper, we develop a Bayesian reconstruction algorithm for HAADF-STEM tomography which models the image formation, the noise characteristics of the measurement, and the inherent smoothness in the object. Reconstructions of polystyrene functionalized Titanium dioxide nano particle assemblies show results that are qualitatively superior to FBP and SIRT reconstructions, significantly suppressing artifacts and enhancing contrast.