학술논문

Processing and properties of high aspect ratio ferroelectric structures
Document Type
Conference
Source
14th IEEE International Symposium on Applications of Ferroelectrics, 2004. ISAF-04. 2004 Applications of Ferroelectrics Applications of Ferroelectrics, 2004. ISAF-04. 2004 14th IEEE International Symposium on. :189-192 2004
Subject
Engineered Materials, Dielectrics and Plasmas
Components, Circuits, Devices and Systems
Ferroelectric materials
Nanostructures
Photonic band gap
Fabrication
Silicon
Optoelectronic and photonic sensors
Etching
Crystallization
Crystalline materials
Nanostructured materials
Language
ISSN
1099-4734
Abstract
High aspect ratio (/spl ges/50:1) ferroelectric structures are potentially applicable in areas such as tunable photonic devices, sensors and actuators. In this work high aspect ratio structures of Pb(Zr/sub x/, Ti/sub 1-x/)O/sub 3/, and LaNiO/sub 3//Pb(Zr/sub x/,Ti/sub 1-x/)O/sub 3//LaNiO/sub 3/ tri-layers were prepared by vacuum infiltration of meso-porous Si templates. Pyrolysis was done at 300/spl deg/C for 2 min. Reactive ion etching followed by XeF/sub 2/ isotropic Si etching was utilized to release the embedded PZT structures from the Si template. The released structures were annealed at 700/spl deg/C for 1 min. in order to induce crystallization. These 2D ferroelectric photonic structures exhibited a TE-mode band gap in the infrared region between 4.0 - 4.4 microns in wavelength, which was found to be consistent with the theoretical photonic band gap calculations.