학술논문

A Survey on Deep Learning Event Extraction: Approaches and Applications
Document Type
Periodical
Source
IEEE Transactions on Neural Networks and Learning Systems IEEE Trans. Neural Netw. Learning Syst. Neural Networks and Learning Systems, IEEE Transactions on. 35(5):6301-6321 May, 2024
Subject
Computing and Processing
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
General Topics for Engineers
Task analysis
Deep learning
Electronic mail
Data mining
Measurement
Feature extraction
Technological innovation
evaluation metrics
event extraction (EE)
research trends
Language
ISSN
2162-237X
2162-2388
Abstract
Event extraction (EE) is a crucial research task for promptly apprehending event information from massive textual data. With the rapid development of deep learning, EE based on deep learning technology has become a research hotspot. Numerous methods, datasets, and evaluation metrics have been proposed in the literature, raising the need for a comprehensive and updated survey. This article fills the research gap by reviewing the state-of-the-art approaches, especially focusing on the general domain EE based on deep learning models. We introduce a new literature classification of current general domain EE research according to the task definition. Afterward, we summarize the paradigm and models of EE approaches, and then discuss each of them in detail. As an important aspect, we summarize the benchmarks that support tests of predictions and evaluation metrics. A comprehensive comparison among different approaches is also provided in this survey. Finally, we conclude by summarizing future research directions facing the research area.