학술논문
High-Resolution Anamorphic SPECT Imaging
Document Type
Periodical
Author
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 61(3):1126-1135 Jun, 2014
Subject
Language
ISSN
0018-9499
1558-1578
1558-1578
Abstract
We have developed a gamma-ray imaging system that combines a high-resolution silicon detector with two sets of movable, half-keel-edged copper-tungsten blades configured as crossed slits. These apertures can be positioned independently between the object and detector, producing an anamorphic image in which the axial and transaxial magnifications are not constrained to be equal. The detector is a $60~\hbox{mm}\times 60~\hbox{mm}$, one-millimeter-thick, one-megapixel silicon double-sided strip detector with a strip pitch of $59~\mu \hbox{m}$. The flexible nature of this system allows the application of adaptive imaging techniques. We present system details; calibration, acquisition, and reconstruction methods; and imaging results.