부산대학교 도서관

This paper focuses on the radiation-induced dose and single-event effects (SEEs) on a color CMOS camera designed for space missions. The $\gamma $ -ray and proton tests are used to evaluate the tolerance against cumulative dose effects. The dark current of the image sensor is the main parameter impacted by dose effects. Heavy ions testing is performed to evaluate SEEs. single-event upset, single-event functional interrupt, and single-event latchup have been observed and mitigation techniques were proposed for specific space missions.