학술논문
Ultrafast ~7 Mbps True Random Number Generator Based on SNGCT Selector
Document Type
Periodical
Author
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(4):2794-2800 Apr, 2024
Subject
Language
ISSN
0018-9383
1557-9646
1557-9646
Abstract
A novel true random number generator (TRNG) approach is presented using the state-of-the-art SNGCT selectors as a randomness source. Thanks to the selector back-end-of-line compatibility, the randomness source can be integrated directly in nonvolatile memory arrays to reduce cell area and improve security. A record-high 7 Mbps bitrate is demonstrated at both 30 °C and 125 °C. The randomness is validated through the standard NIST SP800-22 assessment. A complete assessment of the limits of the current implementation is done. With further circuit integration, beyond 100 Mbps at 0.3 pJ/bits is expected with the capability of 1014 bits per selector.