학술논문
Modeling of the Optical and Electrical Degradation of 845 nm VCSILs
Document Type
Conference
Author
Source
2023 Conference on Lasers and Electro-Optics (CLEO) Lasers and Electro-Optics (CLEO), 2023 Conference on. :1-2 May, 2023
Subject
Language
Abstract
Optical and electrical degradation of novel micro-transfer-printed VCSILs is investigated. Modeling of experimental data suggests that the main degradation mechanism is represented by the relocation of impurities, originating from the p-side, toward the active region.