부산대학교 도서관

Models for cache yield and coverage for radiation-induced soft errors quantify the trade-off between the minimum supply voltage (V MIN ) and the soft-error protection when applying error-correcting codes (ECC) to a cache. Model predictions of the V MIN benefit and soft-error coverage agree closely with silicon measurements from a 7Mb data cache in a 20nm test chip when considering either single-error correction, double-error detection (SECDED) or double-error correction, triple-error detection (DECTED) codes. Silicon measurements demonstrate a V MIN reduction of 19% and 27% from SECDED and DECTED, respectively, as compared to a cache without ECC. Moreover, silicon measurements highlight a salient insight in that only 0.12% of the cache words contain an error when operating at the cache V MIN with SECDED. Thus, SECDED simultaneously enables a 19% lower V MIN and 99.88% coverage for radiation-induced soft errors. Model projections indicate larger benefits in V MIN and soft-error protection as future cache sizes increase.