학술논문

Performance Characterization of Advanced Interconnects on High Speed VLSI Circuits
Document Type
Conference
Source
30th European Solid-State Device Research Conference Solid-State Device Research Conference, 2000. Proceeding of the 30th European. :216-219 2000
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Integrated circuit interconnections
Very large scale integration
Dielectric substrates
Impedance
Dielectric measurements
Crosstalk
Frequency
Passivation
Distortion measurement
Propagation constant
Language