학술논문

Spatial and Statistical Modeling of Multi-Panel Millimeter Wave Self-Interference
Document Type
Periodical
Source
IEEE Journal on Selected Areas in Communications IEEE J. Select. Areas Commun. Selected Areas in Communications, IEEE Journal on. 41(9):2780-2795 Sep, 2023
Subject
Communication, Networking and Broadcast Technologies
Interference cancellation
Millimeter wave communication
Full-duplex system
Phased arrays
Antenna measurements
Array signal processing
Signal to noise ratio
Full-duplex
self-interference
phased arrays
channel modeling
measurements
millimeter wave
Language
ISSN
0733-8716
1558-0008
Abstract
Characterizing self-interference is essential to the design and evaluation of in-band full-duplex communication systems. Until now, little has been understood about this coupling in full-duplex systems operating at millimeter wave (mmWave) frequencies, and it has been shown that the highly-idealized models proposed for such do not align with practice. This work presents the first spatial and statistical model of mmWave self-interference backed by measurements, enabling engineers to draw realizations that exhibit the large-scale and small-scale spatial characteristics observed in our nearly 6.5 million measurements taken at 28 GHz. Core to our model is its use of system and model parameters having real-world meaning, which facilitates its extension to systems beyond our own phased array platform through proper parameterization. We demonstrate this by collecting nearly 13 million additional measurements to show that our model can generalize to two other system configurations. We assess our model by comparing it against actual measurements to confirm its ability to align spatially and in distribution with real-world self-interference. In addition, using both measurements and our model of self-interference, we evaluate an existing beamforming-based full-duplex mmWave solution to illustrate that our model can be reliably used to design new solutions and validate the performance improvements they may offer.