학술논문
Phenomenological Approach to Simulation of Proton Indirect-Ionization Induced Upset Cross Sections in Commercial Memory Circuits
Document Type
Conference
Author
Source
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2018 18th European Conference on. :1-4 Sep, 2018
Subject
Language
ISSN
1609-0438
Abstract
A procedure for proton-induced upset cross section simulation based on the limited heavy ion experimental data is proposed. Validation and comparison to the existing techniques are provided as well.