학술논문

Compact modeling of soft error rate in space environment
Document Type
Conference
Source
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2016 16th European Conference on. :1-5 Sep, 2016
Subject
Components, Circuits, Devices and Systems
Error analysis
Ions
Interpolation
Uncertainty
Sensitivity
Mathematical model
Shape
Cross section
heavy ion
modeling
multiple cell upset
single event effects
soft error rate
Language
Abstract
Based on a novel parameterization of the SEU cross-section vs LET dependence, a new procedure for heavy ion-induced soft error rate calculation, which is adapted to the multiple cell upsets in highly scaled memories, is proposed.