학술논문

Displacement Damage Effects Mitigation Approach for Heterojunction Bipolar Transistor Frequency Synthesizers
Document Type
Periodical
Source
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 67(11):2396-2404 Nov, 2020
Subject
Nuclear Engineering
Bioengineering
Heterojunction bipolar transistors
Gallium arsenide
Silicon germanium
Voltage-controlled oscillators
Integrated circuits
Degradation
Radio frequency
Displacement damage (DD) effects
frequency divider (FD)
gallium arsenide (GaAs)
heterojunction bipolar transistor (HBT)
mitigation approach
radiation effect model
radio frequency (RF)
silicon–germanium (SiGe)
temperature effects
voltage-controlled oscillator (VCO)
wide-band amplifier (WBA)
Language
ISSN
0018-9499
1558-1578
Abstract
This work focuses on the design issues of radio frequency (RF) bipolar integrated circuits (ICs) as a part of frequency synthesizers for extreme environmental applications. It is shown that silicon–germanium (SiGe) and gallium arsenide (GaAs) heterojunction bipolar transistors (HBTs) as well as bipolar RF ICs (including frequency dividers, voltage-controlled oscillators, and wide-band amplifiers) are highly sensitive to ambient temperature and radiation-induced displacement damage. This article also presents a design approach based on specialized HBT macromodels and hardening techniques.