학술논문

Temperature-Dependent Electrical Properties of Graphitic Carbon Schottky Contacts to β-Ga₂O₃
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5669-5675 Dec, 2020
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Carbon
Schottky diodes
Temperature measurement
Schottky barriers
Contacts
Gallium
Sputtering
Fermi level pinning (FLP)
semiconductor interface
Language
ISSN
0018-9383
1557-9646
Abstract
Graphitic (sp 2 -rich) carbon Schottky contacts to ( $\overline {2}01$ ) $\beta $ -Ga 2 O 3 were fabricated using sputtering and energetic ion deposition with and without the use of an oxygen plasma. As-deposited contacts exhibited room temperature effective barrier heights between 0.80 and 1.20 eV, depending on the deposition technique. After moderate heat treatment (595 K in N 2 ) the work function of the oxygenated graphitic contacts increased by 0.5–0.8 eV. This resulted in a permanent increase in barrier height (up to 1.6 eV) and a corresponding 3–4 orders of magnitude increase in current rectification (at ±3 V). The barrier heights of the heat-treated oxygenated graphitic Schottky contacts agree well with the Mott–Schottky model, suggesting an absence of Fermi level pinning at the C/ $\beta $ -Ga 2 O 3 interface.