학술논문

High-Temperature $\beta$ -Ga2O3 Schottky Diodes and UVC Photodetectors Using RuOx Contacts
Document Type
Periodical
Source
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 40(10):1587-1590 Oct, 2019
Subject
Engineered Materials, Dielectrics and Plasmas
Components, Circuits, Devices and Systems
Leakage currents
Schottky barriers
Heating systems
Temperature measurement
Current measurement
Schottky diodes
Photodetectors
High temperature devices
Schottky contacts
UV photodetectors
ruthenium dioxide
Ga₂O₃
RuO₂
Language
ISSN
0741-3106
1558-0563
Abstract
High-temperature $\beta $ -Ga {2} O {3} Schottky diodes with very low leakage currents, capable of sensitive UVC detection at 350°C, were fabricated on $({\bar{2}}{01})$ -Ga 2 O 3 single crystal substrates using intentionally-oxidized ruthenium (RuO x ) Schottky contacts (SCs), with x =~ 2.1. These RuO x : $\beta $ -Ga 2 O 3 SCs were characterized by rectification ratios of more than 10 10 at ±3 V and very low reverse leakage current densities of less than 1 nAcm −2 (~1 pA) at −3.0 V, that were unchanged from 24 to 350 °C. These very low high-temperature leakage currents were due to their extremely high Schottky barriers of 2.2 eV at 350°C, that were stable against repeated operation at this temperature. Although not optimized for photodetection, these SCs could detect UVC ( $\lambda = {248}$ nm) radiation at a temperature of 350 °C with a UVC/dark current ratio of ~10 3 . The very high and thermally stable rectifying barriers of these RuO x : $\beta $ -Ga 2 O 3 SCs makes them strong candidates for use in high temperature $\beta $ -Ga 2 O 3 rectifying diodes and UVC photodetectors.