부산대학교 도서관

Image difference operation is frequently used in automated printed circuit board (PCB) inspection system as well as in many other image processing applications. The previously proposed wavelet-based PCB inspection approach also incorporated the point-to-point image difference operation as part of its algorithm. Unfortunately, during the implementation, this operation brings along the unwanted noise due to misalignment and uneven binarization. Thus, this paper proposes a method to eliminate, if possible, or to reduce as much as possible such noise during the computation of defect detection. The results of applying the proposed method showed a significant improvement during the real-time inspection of printed circuit boards.