학술논문
Photoelectric Characterization of a Single Layer of CNTs using CAFM
Document Type
Conference
Source
2022 IEEE 22nd International Conference on Nanotechnology (NANO) Nanotechnology (NANO), 2022 IEEE 22nd International Conference on. :186-189 Jul, 2022
Subject
Language
ISSN
1944-9380
Abstract
Detailed investigations for the photoelectric characteristics of a single-layer of carbon nanotubes (CNTs) have been performed using a conductive mode atomic force microscope (CAFM). The diluted CNTs were drop-casted on a SiO 2 /n-Si substrate followed by annealing in N 2 ambient for 2 hours at 70°C. Individual CNTs were identified using the AC imaging mode of atomic force microscope (AFM). Subsequently, the electrical measurements were performed using CAFM with an Au-coated tip placed directly on the CNTs. A lower turn-on voltage is observed for the shorter wavelength of light illuminated on the CNTs, compared to that of a long light wavelength, indicating higher energy electrons are excited to the conduction band of the CNT.