학술논문
Study of the processes χ cJ → Ξ − Ξ ¯ $$ \overline{\Xi} $$ + and Ξ0 Ξ ¯ $$ \overline{\Xi} $$ 0
Document Type
article
Author
The BESIII collaboration; M. Ablikim; M.N. Achasov; P. Adlarson; S. Ahmed; M. Albrecht; R. Aliberti; A. Amoroso; M.R. An; Q. An; X.H. Bai; Y. Bai; O. Bakina; R. Baldini Ferroli; I. Balossino; Y. Ban; K. Begzsuren; N. Berger; M. Bertani; D. Bettoni; F. Bianchi; J. Bloms; A. Bortone; I. Boyko; R.A. Briere; H. Cai; X. Cai; A. Calcaterra; G.F. Cao; N. Cao; S.A. Cetin; J.F. Chang; W.L. Chang; G. Chelkov; D.Y. Chen; G. Chen; H.S. Chen; M.L. Chen; S.J. Chen; X.R. Chen; Y.B. Chen; Z. J Chen; W.S. Cheng; G. Cibinetto; F. Cossio; X.F. Cui; H.L. Dai; X.C. Dai; A. Dbeyssi; R.E. de Boer; D. Dedovich; Z.Y. Deng; A. Denig; I. Denysenko; M. Destefanis; F. De Mori; Y. Ding; C. Dong; J. Dong; L.Y. Dong; M.Y. Dong; X. Dong; S.X. Du; Y.L. Fan; J. Fang; S.S. Fang; Y. Fang; R. Farinelli; L. Fava; F. Feldbauer; G. Felici; C.Q. Feng; J.H. Feng; M. Fritsch; C.D. Fu; Y. Gao; Y.G. Gao; I. Garzia; P.T. Ge; C. Geng; E.M. Gersabeck; A Gilman; K. Goetzen; L. Gong; W.X. Gong; W. Gradl; M. Greco; L.M. Gu; M.H. Gu; C. Y Guan; A.Q. Guo; L.B. Guo; R.P. Guo; Y.P. Guo; A. Guskov; T.T. Han; W.Y. Han; X.Q. Hao; F.A. Harris; K.L. He; F.H. Heinsius; C.H. Heinz; Y.K. Heng; C. Herold; M. Himmelreich; T. Holtmann; G.Y. Hou; Y.R. Hou; Z.L. Hou; H.M. Hu; J.F. Hu; T. Hu; Y. Hu; G.S. Huang; L.Q. Huang; X.T. Huang; Y.P. Huang; Z. Huang; T. Hussain; N Hüsken; W. Ikegami Andersson; W. Imoehl; M. Irshad; S. Jaeger; S. Janchiv; Q. Ji; Q.P. Ji; X.B. Ji; X.L. Ji; Y.Y. Ji; H.B. Jiang; X.S. Jiang; J.B. Jiao; Z. Jiao; S. Jin; Y. Jin; M.Q. Jing; T. Johansson; N. Kalantar-Nayestanaki; X.S. Kang; R. Kappert; M. Kavatsyuk; B.C. Ke; I.K. Keshk; A. Khoukaz; P. Kiese; R. Kiuchi; R. Kliemt; L. Koch; O.B. Kolcu; B. Kopf; M. Kuemmel; M. Kuessner; A. Kupsc; M.G. Kurth; W. Kühn; J.J. Lane; J.S. Lange; P. Larin; A. Lavania; L. Lavezzi; Z.H. Lei; H. Leithoff; M. Lellmann; T. Lenz; C. Li; C.H. Li; Cheng Li; D.M. Li; F. Li; G. Li; H. Li; H.B. Li; H.J. Li; H.N. Li; J.L. Li; J.Q. Li; J.S. Li; Ke Li; L.K. Li; Lei Li; P.R. Li; S.Y. Li; W.D. Li; W.G. Li; X.H. Li; X.L. Li; Xiaoyu Li; Z.Y. Li; H. Liang; Y.F. Liang; Y.T. Liang; G.R. Liao; L.Z. Liao; J. Libby; C.X. Lin; D.X. Lin; T. Lin; B.J. Liu; C.X. Liu; D. Liu; F.H. Liu; Fang Liu; Feng Liu; G.M. Liu; H.M. Liu; Huanhuan Liu; Huihui Liu; J.B. Liu; J.L. Liu; J.Y. Liu; K. Liu; K.Y. Liu; Ke Liu; L. Liu; M.H. Liu; P.L. Liu; Q. Liu; S.B. Liu; T. Liu; W.M. Liu; X. Liu; Y. Liu; Y.B. Liu; Z.A. Liu; Z.Q. Liu; X.C. Lou; F.X. Lu; H.J. Lu; J.D. Lu; J.G. Lu; X.L. Lu; Y. Lu; Y.P. Lu; C.L. Luo; M.X. Luo; P.W. Luo; T. Luo; X.L. Luo; X.R. Lyu; F.C. Ma; H.L. Ma; L.L. Ma; M.M. Ma; Q.M. Ma; R.Q. Ma; R.T. Ma; X.X. Ma; X.Y. Ma; F.E. Maas; M. Maggiora; S. Maldaner; S. Malde; Q.A. Malik; A. Mangoni; Y.J. Mao; Z.P. Mao; S. Marcello; Z.X. Meng; J.G. Messchendorp; G. Mezzadri; T.J. Min; R.E. Mitchell; X.H. Mo; N. Yu. Muchnoi; H. Muramatsu; S. Nakhoul; Y. Nefedov; F. Nerling; I.B. Nikolaev; Z. Ning; S. Nisar; Q. Ouyang; S. Pacetti; X. Pan; Y. Pan; A. Pathak; P. Patteri; M. Pelizaeus; H.P. Peng; K. Peters; J. Pettersson; J.L. Ping; R.G. Ping; S. Pogodin; R. Poling; V. Prasad; H. Qi; H.R. Qi; M. Qi; T.Y. Qi; S. Qian; W.B. Qian; Z. Qian; C.F. Qiao; J.J. Qin; L.Q. Qin; X.P. Qin; X.S. Qin; Z.H. Qin; J.F. Qiu; S.Q. Qu; K.H. Rashid; K. Ravindran; C.F. Redmer; A. Rivetti; V. Rodin; M. Rolo; G. Rong; Ch. Rosner; M. Rump; H.S. Sang; A. Sarantsev; Y. Schelhaas; C. Schnier; K. Schoenning; M. Scodeggio; W. Shan; X.Y. Shan; J.F. Shangguan; M. Shao; C.P. Shen; H.F. Shen; X.Y. Shen; H.C. Shi; R.S. Shi; X. Shi; X. D Shi; J.J. Song; W.M. Song; Y.X. Song; S. Sosio; S. Spataro; K.X. Su; P.P. Su; F.F. Sui; G.X. Sun; H.K. Sun; J.F. Sun; L. Sun; S.S. Sun; T. Sun; W.Y. Sun; X Sun; Y.J. Sun; Y.Z. Sun; Z.T. Sun; Y.H. Tan; Y.X. Tan; C.J. Tang; G.Y. Tang; J. Tang; J.X. Teng; V. Thoren; W.H. Tian; Y.T. Tian; I. Uman; B. Wang; C.W. Wang; D.Y. Wang; H.J. Wang; H.P. Wang; K. Wang; L.L. Wang; M. Wang; M.Z. Wang; Meng Wang; S. Wang; W. Wang; W.H. Wang; W.P. Wang; X. Wang; X.F. Wang; X.L. Wang; Y. Wang; Y.D. Wang; Y.F. Wang; Y.Q. Wang; Y.Y. Wang; Z. Wang; Z.Y. Wang; Ziyi Wang; Zongyuan Wang; D.H. Wei; F. Weidner; S.P. Wen; D.J. White; U. Wiedner; G. Wilkinson; M. Wolke; L. Wollenberg; J.F. Wu; L.H. Wu; L.J. Wu; X. Wu; X.H. Wu; Z. Wu; L. Xia; H. Xiao; S.Y. Xiao; Z.J. Xiao; X.H. Xie; Y.G. Xie; Y.H. Xie; T.Y. Xing; C.J. Xu; G.F. Xu; Q.J. Xu; W. Xu; X.P. Xu; Y.C. Xu; F. Yan; L. Yan; W.B. Yan; W.C. Yan; H.J. Yang; H.X. Yang; L. Yang; S.L. Yang; Y.X. Yang; Yifan Yang; Zhi Yang; M. Ye; M.H. Ye; J.H. Yin; Z.Y. You; B.X. Yu; C.X. Yu; G. Yu; J.S. Yu; T. Yu; C.Z. Yuan; L. Yuan; X.Q. Yuan; Y. Yuan; Z.Y. Yuan; C.X. Yue; A.A. Zafar; X. Zeng; Y. Zeng; A.Q. Zhang; B.X. Zhang; Guangyi Zhang; H. Zhang; H.H. Zhang; H.Y. Zhang; J.J. Zhang; J.L. Zhang; J.Q. Zhang; J.W. Zhang; J.Y. Zhang; J.Z. Zhang; Jianyu Zhang; Jiawei Zhang; L.M. Zhang; L.Q. Zhang; Lei Zhang; S. Zhang; S.F. Zhang; Shulei Zhang; X.D. Zhang; X.Y. Zhang; Y. Zhang; Y.T. Zhang; Y.H. Zhang; Yan Zhang; Yao Zhang; Z.Y. Zhang; G. Zhao; J. Zhao; J.Y. Zhao; J.Z. Zhao; Lei Zhao; Ling Zhao; M.G. Zhao; Q. Zhao; S.J. Zhao; Y.B. Zhao; Y.X. Zhao; Z.G. Zhao; A. Zhemchugov; B. Zheng; J.P. Zheng; Y.H. Zheng; B. Zhong; C. Zhong; L.P. Zhou; Q. Zhou; X. Zhou; X.K. Zhou; X.R. Zhou; X.Y. Zhou; A.N. Zhu; J. Zhu; K. Zhu; K.J. Zhu; S.H. Zhu; T.J. Zhu; W.J. Zhu; Y.C. Zhu; Z.A. Zhu; B.S. Zou; J.H. Zou
Source
Journal of High Energy Physics, Vol 2022, Iss 6, Pp 1-18 (2022)
Subject
Language
English
ISSN
1029-8479
Abstract
Abstract Using 448.1 × 106 ψ(3686) decays collected with the BESIII detector at the BEPCII e + e − storage rings, the branching fractions and angular distributions of the decays χ cJ → Ξ − Ξ ¯ $$ \overline{\Xi} $$ + and Ξ0 Ξ ¯ $$ \overline{\Xi} $$ 0 (J = 0, 1, 2) are measured based on a partial-reconstruction technique. The decays χ c1 → Ξ0 Ξ ¯ $$ \overline{\Xi} $$ 0 and χ c2 → Ξ0 Ξ ¯ $$ \overline{\Xi} $$ 0 are observed for the first time with statistical significances of 7σ and 15σ, respectively. The results of this analysis are in good agreement with previous measurements and have significantly improved precision.