학술논문

Fault-tolerant universal reversible gate design in QCA nanotechnology
Document Type
article
Source
e-Prime: Advances in Electrical Engineering, Electronics and Energy, Vol 7, Iss , Pp 100435- (2024)
Subject
QCA
3 × 3 gate
Fault-tolerance
Reversible
Universal
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
Language
English
ISSN
2772-6711
Abstract
Quantum-dot cellular automata (QCA) nanotechnology is the best suited technology for the nanocomputing applications. The limitations of the conventional transistors in nanoscale region can be removed by QCA nanotechnology. Hence, this paper proposes a novel design and implementation of a 3 × 3 universal and reversible gate in QCA nanotechnology. The proposed gate requires only 39 cells and has a total area of 0.029 µm2 with a latency of 0.25. The proposed gate is evaluated for the various possible defects and the performance parameters. The proposed gate is also compared with the existing gates and the proposed gate is established as the most efficient and productive.