학술논문

Science Opportunities at the SwissFEL X-ray Laser
Document Type
article
Source
CHIMIA, Vol 68, Iss 1-2 (2014)
Subject
Cross correlations
Free electron laser
Photochemistry
Pump and probe experiments
Single shot spectroscopy
X-ray diffraction
Chemistry
QD1-999
Language
German
English
French
ISSN
0009-4293
2673-2424
Abstract
Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude higher than that of a synchrotron. These pulses will allow studies of femtosecond dynamics at nanometer resolution and with chemical selectivity. They will produce diffraction images of organic and inorganic nanostructures without deleterious effects of radiation damage.