학술논문
Variable temperature automatic sample shifting device for X-ray small-angle scattering measurement
Document Type
article
Author
Source
He jishu, Vol 44, Iss 11, Pp 110101-110101 (2021)
Subject
Language
Chinese
ISSN
0253-3219
Abstract
BackgroundVariable temperature condition is the most extensive requirement in many scattering experiments. Automatic sample shifting technology based on the variable temperature condition can significantly improve the detection efficiency of samples.PurposeThis study aims to develop a varied temperature automatic sample shifting device for synchrotron radiation small angle X-ray scattering (SAXS) experiment.MethodsThe device was designed to accommodate up to 100 samples, covering a wide temperature range of 25~280 °C with temperature control accuracy of ±1 °C. Two-dimensional mobile platform was used to control sample switching, and the temperature controller and heating element were used to control the sample temperature of experiment. In addition, the temperature-stroke coupling control software suitable for this device was implemented to realize the remote control of sample switching and temperature changing. The structure and the temperature distribution of the sample rack were analyzed by numerical simulation and compared with that of experiment to finalize the appropriate structure for this device.Results & ConclusionsThe maximum error between the simulated temperature and the measured temperature is less than 2% and the structure design is reasonable, satisfying multi-sample variable temperature test requirements for SAXS experiment.