학술논문

A New Cell Topology for 4H-SiC Planar Power MOSFETs for High-Frequency Switching
Document Type
article
Source
Materials, Vol 15, Iss 19, p 6690 (2022)
Subject
SiC power MOSFET
cell topology
dodecagonal cell
octagonal cell
gate-to-drain capacitance (Cgd)
specific ON-resistance (Ron,sp)
Technology
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
Engineering (General). Civil engineering (General)
TA1-2040
Microscopy
QH201-278.5
Descriptive and experimental mechanics
QC120-168.85
Language
English
ISSN
15196690
1996-1944
Abstract
A new cell topology named the dodecagonal (a polygon with twelve sides, short for Dod) cell is proposed to optimize the gate-to-drain capacitance (Cgd) and reduce the specific ON-resistance (Ron,sp) of 4H-SiC planar power MOSFETs. The Dod and the octagonal (Oct) cells are used in the layout design of the 650 V SiC MOSFETs in this work. The experimental results confirm that the Dod-cell MOSFET achieves a 2.2× lower Ron,sp, 2.1× smaller high-frequency figure of merit (HF-FOM), higher turn on/off dv/dt, and 29% less switching loss than the fabricated Oct-cell MOSFET. The results demonstrate that the Dod cell is an attractive candidate for high-frequency power applications.