학술논문
Measurement of the phase between strong and electromagnetic amplitudes of J/ψ decays
Document Type
article
Author
M. Ablikim; M.N. Achasov; S. Ahmed; M. Albrecht; A. Amoroso; F.F. An; Q. An; Y. Bai; O. Bakina; R. Baldini Ferroli; Y. Ban; D.W. Bennett; J.V. Bennett; N. Berger; M. Bertani; D. Bettoni; J.M. Bian; F. Bianchi; E. Boger; I. Boyko; R.A. Briere; H. Cai; X. Cai; O. Cakir; A. Calcaterra; G.F. Cao; S.A. Cetin; J. Chai; J.F. Chang; G. Chelkov; G. Chen; H.S. Chen; J.C. Chen; M.L. Chen; P.L. Chen; S.J. Chen; X.R. Chen; Y.B. Chen; X.K. Chu; G. Cibinetto; H.L. Dai; J.P. Dai; A. Dbeyssi; D. Dedovich; Z.Y. Deng; A. Denig; I. Denysenko; M. Destefanis; F. De Mori; Y. Ding; C. Dong; J. Dong; L.Y. Dong; M.Y. Dong; Z.L. Dou; S.X. Du; P.F. Duan; J. Fang; S.S. Fang; X. Fang; Y. Fang; R. Farinelli; L. Fava; S. Fegan; F. Feldbauer; G. Felici; C.Q. Feng; E. Fioravanti; M. Fritsch; C.D. Fu; Q. Gao; X.L. Gao; Y. Gao; Y.G. Gao; Z. Gao; I. Garzia; K. Goetzen; L. Gong; W.X. Gong; W. Gradl; M. Greco; M.H. Gu; S. Gu; Y.T. Gu; A.Q. Guo; L.B. Guo; R.P. Guo; Y.P. Guo; Z. Haddadi; S. Han; X.Q. Hao; F.A. Harris; K.L. He; F.H. Heinsius; T. Held; Y.K. Heng; T. Holtmann; Z.L. Hou; C. Hu; H.M. Hu; T. Hu; Y. Hu; G.S. Huang; J.S. Huang; X.T. Huang; X.Z. Huang; Z.L. Huang; T. Hussain; W. Ikegami Andersson; Q. Ji; Q.P. Ji; X.B. Ji; X.L. Ji; X.S. Jiang; X.Y. Jiang; J.B. Jiao; Z. Jiao; D.P. Jin; S. Jin; Y. Jin; T. Johansson; A. Julin; N. Kalantar-Nayestanaki; X.L. Kang; X.S. Kang; M. Kavatsyuk; B.C. Ke; T. Khan; A. Khoukaz; P. Kiese; R. Kliemt; L. Koch; O.B. Kolcu; B. Kopf; M. Kornicer; M. Kuemmel; M. Kuessner; M. Kuhlmann; A. Kupsc; W. Kühn; J.S. Lange; M. Lara; P. Larin; L. Lavezzi; S. Leiber; H. Leithoff; C. Leng; C. Li; Cheng Li; D.M. Li; F. Li; F.Y. Li; G. Li; H.B. Li; H.J. Li; J.C. Li; K.J. Li; Kang Li; Ke Li; Lei Li; P.L. Li; P.R. Li; Q.Y. Li; T. Li; W.D. Li; W.G. Li; X.L. Li; X.N. Li; X.Q. Li; Z.B. Li; H. Liang; Y.F. Liang; Y.T. Liang; G.R. Liao; D.X. Lin; B. Liu; B.J. Liu; C.X. Liu; D. Liu; F.H. Liu; Fang Liu; Feng Liu; H.B. Liu; H.M. Liu; Huanhuan Liu; Huihui Liu; J.B. Liu; J.P. Liu; J.Y. Liu; K. Liu; K.Y. Liu; Ke Liu; L.D. Liu; P.L. Liu; Q. Liu; S.B. Liu; X. Liu; Y.B. Liu; Z.A. Liu; Zhiqing Liu; Y.F. Long; X.C. Lou; H.J. Lu; J.G. Lu; Y. Lu; Y.P. Lu; C.L. Luo; M.X. Luo; X.L. Luo; X.R. Lyu; F.C. Ma; H.L. Ma; L.L. Ma; M.M. Ma; Q.M. Ma; T. Ma; X.N. Ma; X.Y. Ma; Y.M. Ma; F.E. Maas; M. Maggiora; Q.A. Malik; Y.J. Mao; Z.P. Mao; S. Marcello; Z.X. Meng; J.G. Messchendorp; G. Mezzadri; J. Min; T.J. Min; R.E. Mitchell; X.H. Mo; Y.J. Mo; C. Morales Morales; G. Morello; N.Yu. Muchnoi; H. Muramatsu; A. Mustafa; Y. Nefedov; F. Nerling; I.B. Nikolaev; Z. Ning; S. Nisar; S.L. Niu; X.Y. Niu; S.L. Olsen; Q. Ouyang; S. Pacetti; Y. Pan; M. Papenbrock; P. Patteri; M. Pelizaeus; J. Pellegrino; H.P. Peng; K. Peters; J. Pettersson; J.L. Ping; R.G. Ping; A. Pitka; R. Poling; V. Prasad; H.R. Qi; M. Qi; S. Qian; C.F. Qiao; N. Qin; X.S. Qin; Z.H. Qin; J.F. Qiu; K.H. Rashid; C.F. Redmer; M. Richter; M. Ripka; M. Rolo; G. Rong; Ch. Rosner; X.D. Ruan; A. Sarantsev; M. Savrié; C. Schnier; K. Schoenning; W. Shan; M. Shao; C.P. Shen; P.X. Shen; X.Y. Shen; H.Y. Sheng; J.J. Song; W.M. Song; X.Y. Song; S. Sosio; C. Sowa; S. Spataro; G.X. Sun; J.F. Sun; L. Sun; S.S. Sun; X.H. Sun; Y.J. Sun; Y.K. Sun; Y.Z. Sun; Z.J. Sun; Z.T. Sun; C.J. Tang; G.Y. Tang; X. Tang; I. Tapan; M. Tiemens; B. Tsednee; I. Uman; G.S. Varner; B. Wang; B.L. Wang; D. Wang; D.Y. Wang; Dan Wang; K. Wang; L.L. Wang; L.S. Wang; M. Wang; Meng Wang; P. Wang; P.L. Wang; W.P. Wang; X.F. Wang; Y. Wang; Y.D. Wang; Y.F. Wang; Y.Q. Wang; Z. Wang; Z.G. Wang; Z.H. Wang; Z.Y. Wang; Zongyuan Wang; T. Weber; D.H. Wei; P. Weidenkaff; S.P. Wen; U. Wiedner; M. Wolke; L.H. Wu; L.J. Wu; Z. Wu; L. Xia; X. Xia; Y. Xia; D. Xiao; H. Xiao; Y.J. Xiao; Z.J. Xiao; Y.G. Xie; Y.H. Xie; X.A. Xiong; Q.L. Xiu; G.F. Xu; J.J. Xu; L. Xu; Q.J. Xu; Q.N. Xu; X.P. Xu; L. Yan; W.B. Yan; W.C. Yan; Y.H. Yan; H.J. Yang; H.X. Yang; L. Yang; Y.H. Yang; Y.X. Yang; Yifan Yang; M. Ye; M.H. Ye; J.H. Yin; Z.Y. You; B.X. Yu; C.X. Yu; J.S. Yu; C.Z. Yuan; Y. Yuan; A. Yuncu; A.A. Zafar; A. Zallo; Y. Zeng; Z. Zeng; B.X. Zhang; B.Y. Zhang; C.C. Zhang; D.H. Zhang; H.H. Zhang; H.Y. Zhang; J. Zhang; J.L. Zhang; J.Q. Zhang; J.W. Zhang; J.Y. Zhang; J.Z. Zhang; K. Zhang; L. Zhang; S.Q. Zhang; X.Y. Zhang; Y.H. Zhang; Y.T. Zhang; Yang Zhang; Yao Zhang; Yu Zhang; Z.H. Zhang; Z.P. Zhang; Z.Y. Zhang; G. Zhao; J.W. Zhao; J.Y. Zhao; J.Z. Zhao; Lei Zhao; Ling Zhao; M.G. Zhao; Q. Zhao; S.J. Zhao; T.C. Zhao; Y.B. Zhao; Z.G. Zhao; A. Zhemchugov; B. Zheng; J.P. Zheng; W.J. Zheng; Y.H. Zheng; B. Zhong; L. Zhou; X. Zhou; X.K. Zhou; X.R. Zhou; X.Y. Zhou; Y.X. Zhou; J. Zhu; K. Zhu; K.J. Zhu; S. Zhu; S.H. Zhu; X.L. Zhu; Y.C. Zhu; Y.S. Zhu; Z.A. Zhu; J. Zhuang; B.S. Zou; J.H. Zou
Source
Physics Letters B, Vol 791, Iss , Pp 375-384 (2019)
Subject
Language
English
ISSN
0370-2693
Abstract
Using 16 energy points of e+e− annihilation data collected in the vicinity of the J/ψ resonance with the BESIII detector and with a total integrated luminosity of around 100pb−1, we study the relative phase between the strong and electromagnetic amplitudes of J/ψ decays. The relative phase between J/ψ electromagnetic decay and the continuum process (e+e− annihilation without the J/ψ resonance) is confirmed to be zero by studying the cross section lineshape of μ+μ− production. The relative phase between J/ψ strong and electromagnetic decays is then measured to be (84.9±3.6)∘ or (−84.7±3.1)∘ for the 2(π+π−)π0 final state by investigating the interference pattern between the J/ψ decay and the continuum process. This is the first measurement of the relative phase between J/ψ strong and electromagnetic decays into a multihadron final state using the lineshape of the production cross section. We also study the production lineshape of the multihadron final state ηπ+π− with η→π+π−π0, which provides additional information about the phase between the J/ψ electromagnetic decay amplitude and the continuum process. Additionally, the branching fraction of J/ψ→2(π+π−)π0 is measured to be (4.73±0.44)% or (4.85±0.45)%, and the branching fraction of J/ψ→ηπ+π− is measured to be (3.78±0.68)×10−4. Both of them are consistent with the world average values. The quoted uncertainties include both statistical and systematic uncertainties, which are mainly caused by the low statistics. Keywords: Phase, Strong amplitude, Electromagnetic amplitude, J/ψ decay, BESIII