학술논문
SRAM存储器动态参数测试向量分析 / Test Pattern Analysis of SRAM Dynamic Parameter
Document Type
Academic Journal
Author
Source
电子与封装 / Electronics and Packaging. (5):4-32
Subject
Language
Chinese
ISSN
1681-1070
Abstract
半导体存储器一般由存储体、地址译码驱动器、读/写放大器和控制电路组成，是一种能存储大量信息的器件，它是由许多存储单元组成的。半导体存储器的测试有功能测试、直流参数测试、交流参数测试，而功能测试和交流参数测试对存储器来说是至关重要的。SRAM（静态随机存储器）的功能测试是通过算法图形发生器产生不同的测试图形，对被测器件各个不同存储单位进行读写操作，以检查其功能。主要讲述了SRAM交流参数测试原理及其测试关键技术，介绍了SRAM交流参数测试的故障模型。通过研究SRAM交流参数测试图形向量，给出了SRAM交流参数测试图形向量的优化方法。
The test method of SRAM includes function parameters, DC parameters and AC parameters. The key are Function parameters and AC parameters. The function test method of SRAM need apply with pattern generator. It can inspect function with read-write operation. The article presents test method and test principle of SRAM Dynamic Parameter, and introduces fault model of it. According to the research of test pattern and vector, the experiment results optimize method of test pattern and vector.
The test method of SRAM includes function parameters, DC parameters and AC parameters. The key are Function parameters and AC parameters. The function test method of SRAM need apply with pattern generator. It can inspect function with read-write operation. The article presents test method and test principle of SRAM Dynamic Parameter, and introduces fault model of it. According to the research of test pattern and vector, the experiment results optimize method of test pattern and vector.