학술논문
Near-Field Scanning Microwave Microscopy: Measuring Local Microwave Properties and Electric Field Distributions
Document Type
Working Paper
Author
Source
IEEE MTT-S Int. Microwave Symp. Digest, p. 965 (1998)
Subject
Language
Abstract
We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either material properties or local electric fields.
Comment: 4 pages, 8 figures, minor corrections to text and 2 figures
Comment: 4 pages, 8 figures, minor corrections to text and 2 figures