학술논문
Evaluation of the X-ray SOI pixel detector with the on-chip ADC
Document Type
Working Paper
Author
Matsuhashi, Hiroumi; Hagino, Kouichi; Bamba, Aya; Takeda, Ayaki; Yukumoto, Masataka; Mori, Koji; Nishioka, Yusuke; Tsuru, Takeshi Go; Uenomachi, Mizuki; Ikeda, Tomonori; Matsuda, Masamune; Narita, Takuto; Suzuki, Hiromasa; Tanaka, Takaaki; Kurachi, Ikuo; Kohmura, Takayoshi; Uchida, Yusuke; Arai, Yasuo; Kawahito, Shoji
Source
Nuclear Instruments and Methods in Physics Research section A (NIM-A) 2024
Subject
Language
Abstract
XRPIX is the monolithic X-ray SOI (silicon-on-insulator) pixel detector, which has a time resolution better than 10 $\rm{\mu}$s as well as a high detection efficiency for X-rays above 10 keV. XRPIX is planned to be installed on future X-ray satellites. To mount on satellites, it is essential that the ADC (analog-to-digital converter) be implemented on the detector because such peripheral circuits must be as compact as possible to achieve a large imaging area in the limited space in satellites. Thus, we developed a new XRPIX device with the on-chip ADC, and evaluated its performances. As the results, the integral non-linearity was evaluated to be 6 LSB (least significant bit), equivalent to 36 eV. The differential non-linearity was less than 0.7 LSB, and input noise from the on-chip ADC was 5~$\rm{e^{-}}$. Also, we evaluated end-to-end performance including the sensor part as well as the on-chip ADC. As the results, energy resolution at 5.9 keV was 294 $\rm{\pm}$ 4 eV in full-width at half maximum for the best pixel.
Comment: 17 pages, 9 figures, NIMA, accepted
Comment: 17 pages, 9 figures, NIMA, accepted