학술논문
Beam test results of 25 $\mu$m and 35 $\mu$m thick FBK UFSD]{Beam test results of 25 $\mu$m and 35 $\mu$m thick FBK ultra fast silicon detectors
Document Type
Working Paper
Author
Carnesecchi, F.; Strazzi, S.; Alici, A.; Arcidiacono, R.; Borghi, G.; Boscardin, M.; Cartiglia, N.; Vignali, M. Centis; Cavazza, D.; Betta, G. -F. Dalla; Durando, S.; Ferrero, M.; Ficorella, F.; Ali, O. Hammad; Mandurrino, M.; Margotti, A.; Menzio, L.; Nania, R.; Pancheri, L.; Paternoster, G.; Scioli, G.; Siviero, F.; Sola, V.; Tornago, M.; Vignola, G.
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Abstract
This paper presents the measurements on first very thin Ultra Fast Silicon Detectors (UFSDs) produced by Fondazione Bruno Kessler; the data have been collected in a beam test setup at the CERN PS, using beam with a momentum of 12 GeV/c. UFSDs with a nominal thickness of 25 $\mu$m and 35 $\mu$m and an area of 1 $\times$ 1 $\text{mm}^2$ have been considered, together with an additional HPK 50-$\mu$m thick sensor, taken as reference. Their timing performances have been studied as a function of the applied voltage and gain. A time resolution of about 25 ps and of 22 ps at a voltage of 120 V and 240 V has been obtained for the 25 and 35 $\mu$m thick UFSDs, respectively.