학술논문
Radiation hardness of a p-channel notch CCD developed for the X-ray CCD camera onboard the XRISM satellite
Document Type
Working Paper
Author
Kanemaru, Yoshiaki; Sato, Jin; Mori, Koji; Nakajima, Hiroshi; Nishioka, Yusuke; Takeda, Ayaki; Hayashida, Kiyoshi; Matsumoto, Hironori; Iwagaki, Junichi; Okazaki, Koki; Asakura, Kazunori; Yoneyama, Tomokage; Uchida, Hiroyuki; Okon, Hiromichi; Tanaka, Takaaki; Tsuru, Takeshi G.; Tomida, Hiroshi; Shimoi, Takeo; Kohmura, Takayoshi; Hagino, Kouichi; Murakami, Hiroshi; Kobayashi, Shogo B.; Yamauchi, Makoto; Hatsukade, Isamu; Nobukawa, Masayoshi; Nobukawa, Kumiko K.; Hiraga, Junko S.; Uchiyama, Hideki; Yamaoka, Kazutaka; Ozaki, Masanobu; Dotani, Tadayasu; Tsunemi, Hiroshi; Hamano, Tsuyoshi
Source
Journal of Instrumentation, 14, C04003 (2019)
Subject
Language
Abstract
We report the radiation hardness of a p-channel CCD developed for the X-ray CCD camera onboard the XRISM satellite. This CCD has basically the same characteristics as the one used in the previous Hitomi satellite, but newly employs a notch structure of potential for signal charges by increasing the implant concentration in the channel. The new device was exposed up to approximately $7.9 \times 10^{10} \mathrm{~protons~cm^{-2}}$ at 100 MeV. The charge transfer inefficiency was estimated as a function of proton fluence with an ${}^{55} \mathrm{Fe}$ source. A device without the notch structure was also examined for comparison. The result shows that the notch device has a significantly higher radiation hardness than those without the notch structure including the device adopted for Hitomi. This proves that the new CCD is radiation tolerant for space applications with a sufficient margin.
Comment: 10 pages, 6 figures, published in Journal of Instrumentation (JINST)
Comment: 10 pages, 6 figures, published in Journal of Instrumentation (JINST)