학술논문
Dark-Field X-ray Microscopy for 2D and 3D imaging of Microstructural Dynamics at the European X-ray Free Electron Laser
Document Type
Working Paper
Author
Irvine, Sara J.; Katagiri, Kento; Ræder, Trygve M.; Chalise, Darshan; Pal, Dayeeta; Stanton, Jade I.; Ansaldi, Gabriele; Boesenberg, Ulrike; Brauße, Felix; Eggert, Jon H.; Fang, Lichao; Folsom, Eric; Hallmann, Jörg; Haubro, Morten; Holstad, Theodor S.; Madsen, Anders; Möller, Johannes; Nielsen, Martin M.; Poulsen, Henning F.; Pudel, Jan-Etienne; Rodriguez-Fernandez, Angel; Schoofs, Frank; Seiboth, Frank; Wang, Yifan; Wonhyuk, Jo; Youssef, Mohamed; Zozulya, Alexey; Haldrup, Kristoffer; Dresselhaus-Marais, Leora E.
Source
Subject
Language
Abstract
Dark field X-ray microscopy (DXFM) has enabled experiments to visualize microstructural distortions in bulk crystals. Using the femtosecond X-ray pulses generated by X-ray free-electron lasers (XFEL), DFXM can achieve ~1-um spatial resolution and <100 fs time resolution simultaneously. In this paper, we present the first ultrafast DFXM measurements at the European XFEL. In this work, we demonstrate DFXM of laser-induced phonon wavepackets propagating through dislocations inside a diamond single crystal. In addition to demonstrating this new capability, we present two new DFXM scanning techniques for XFEL applications, 3D and axial-strain scans with sub-{\mu}m spatial resolution. With this progress to XFEL DFXM, we discuss new opportunities to study multi-timescale spatio-temporal dynamics of defects, strain waves, and other localized phenomena deep inside crystals.