학술논문
Resonant Soft X-Ray Scattering on LaPt$_2$Si$_2$
Document Type
Working Paper
Author
Mukkattukavil, Deepak John; Hellsvik, Johan; Ghosh, Anirudha; Chatzigeorgiou, Evanthia; Nocerino, Elisabetta; Wang, Qisi; von Arx, Karin; Huang, Shih-Wen; Ekholm, Victor; Hossain, Zakir; Thamizhavel, Arumugum; Chang, Johan; Mansson, Martin; Nordstrom, Lars; Sathe, Conny; Agaker, Marcus; Rubensson, Jan-Erik; Sassa, Yasmine
Source
Subject
Language
Abstract
X-ray absorption (XAS) and Resonant Inelastic X-ray Scattering (RIXS) spectra of LaPt$_2$Si$_2$ single crystal at the Si L and La N edges are presented. The data are interpreted in terms of density functional theory, showing that the Si spectra can be described in terms of Si $s$ and $d$ local partial density of states (LPDOS), and the La spectra are due to quasi-atomic local $4f$ excitations. Calculations show that Pt $d$-LPDOS dominates the occupied states, and a sharp localized La $f$ state is found in the unoccupied states, in line with the observations.