학술논문
Exploration, Prediction, and Experimental Verification of Structure and Optoelectronic Properties in I2 ‑Eu-IV‑X4 (I = Li, Cu, Ag; IV = Si, Ge, Sn; X = S, Se) Chalcogenide Semiconductors.
Document Type
Article
Author
Source
Chemistry of Materials; 1/9/2024, Vol. 36 Issue 1, p340-357, 18p
Subject
Language
ISSN
08974756