학술논문
Defects in CuGaSe2thin films grown by MOCVD
Document Type
Article
Author
Source
Thin Solid Films; February 2000, Vol. 361 Issue: 1 p426-431, 6p
Subject
Language
ISSN
00406090
Abstract
Optical and electrical properties of CuGaSe2/GaAs(001) heteroepitaxial layers as a function of chemical composition are presented. The photoluminescence (PL) spectra observed for Cu-rich epitaxial layers are interpreted in a model consisting of one donor and two acceptor levels with ionization energies of 80, 50 and 10 meV, respectively. The radiative recombination of Ga-rich samples is dominated by broad donor-acceptor-pair bands that shift to lower energies with decreasing Cu/Ga-ratio. The peak energies of these broad emissions are strongly excitation power-dependent showing a blueshift of up to 17 meV per decade. The observed PL properties of Ga-rich samples are discussed in terms of strong compensation as supported by Hall measurements. Hall mobilities of above 250 cm2/V s have been found for near stoichiometric, slightly Ga-rich epitaxial layers. The electrical properties of CuGaSe2/GaAs(001) grown under Cu-rich conditions are found to be influenced by a CuxSe secondary phase as expected from the Cu-Ga-Se phase diagram.