학술논문

The use of EM-CCDs on high resolution soft x-ray spectrometers
Document Type
Article
Source
Proceedings of SPIE; September 2011, Vol. 8145 Issue: 1 p81450L-81450L-12, 8063563p
Subject
Language
ISSN
0277786X
Abstract
Charge-Coupled Devices (CCDs) have been traditionally used on high resolution soft X-ray spectrometers, but with their ability to increase the signal level in the detector before the readout noise of the system is added, Electron-Multiplying CCDs (EM-CCDs) have the potential to offer many advantages in soft X-ray detection. Through this signal multiplication an EM-CCD has advantages over conventioanl CCDs of increased signal, suppressed noise, faster readout speeds for the same equivalent readout noise and an increased inmmunity to Electro-Magnetic Intereference. This paper will look at present and future spacel applications for high resolution soft X-ray spectrometers and assess the advantages and disadvantage of using EM-CCDs in these applications.

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