학술논문
Safety factor profile requirements for electron ITB formation in TCV
Document Type
Article
Author
Goodman, T P; Behn, R; Camenen, Y; Coda, S; Fable, E; Henderson, M A; Nikkola, P; Rossel, J; Sauter, O; Scarabosio, A; Zucca, C; Alberti, S; Amorim, P; Andrèbe, Y; Appert, K; Arnoux, G; Bortolon, A; Bottino, A; Chavan, R; Condrea, I; Droz, E; Duval, B P; Etienne, P; Fasel, D; Fasoli, A; Gulejová, B; Hogge, J-P; Horacek, J; Isoz, P-F; Joye, B; Karpushov, A; Kim, S H; Klimanov, I; Lavanchy, P; Lister, J B; Llobet, X; Madeira, T; Magnin, J-C; Marinoni, A; Márki, J; Marlétaz, B; Marmillod, P; Martin, Y; Martynov, An; Maslov, M; Mayor, J-M; Moret, J-M; Mück, A; Paris, P J; Pavlov, I; Perez, A; Pitts, R A; Pochelon, A; Porte, L; Schlatter, Ch; Schombourg, K; Shidara, H; Siegrist, M; Siravo, U; Sushkov, A V; Tonetti, G; Tran, M Q; Weisen, H; Wischmeier, M; Zabolotsky, A; Zhuang, G; Zhuchkova, A
Source
Plasma Physics and Controlled Fusion; December 2005, Vol. 47 Issue: 12 pB107-B120, 14p
Subject
Language
ISSN
07413335
Abstract
On the Tokamak à Configuration Variable (TCV), electron internal transport barriers (eITBs) can be formed during a gradual evolution from a centrally peaked to a hollow current profile while all external actuators are held constant. The formation occurs rapidly (