학술논문
Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel.
Document Type
Article
Source
Microscopy & Microanalysis; 2001, Vol. 7 Issue 3, p287-291, 5p
Subject
Language
ISSN
14319276