학술논문
A Noise-Shaped VCO-Based Nonuniform Sampling ADC With Phase-Domain Level Crossing.
Document Type
Article
Author
Source
IEEE Journal of Solid-State Circuits; Mar2019, Vol. 54 Issue 3, p623-635, 13p
Subject
Language
ISSN
00189200
Abstract
Copyright of IEEE Journal of Solid-State Circuits is the property of IEEE and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)