학술논문
X-ray testing of Silicon Pore Optics.
Document Type
Article
Author
Vacanti, Giuseppe; Barriére, Nicolas M.; Collon, Maximilien J.; Hauser, Enrico; Babić, Ljubiša; Bayerle, Alex; Girou, David; Günther, Ramses; Keek, Laurens; Landgraf, Boris; Okma, Ben; Verhoeckx, Sjoerd; Vervest, Mark; Voruz, Luc; Bavdaz, Marcos; Wille, Eric; Krumrey, Michael; Müller, Peter; Handick, Evelyn
Source
Proceedings of SPIE; 7/1/2019, Vol. 11119, p1-9, 9p
Subject
Language
ISSN
0277786X