학술논문

Plasma dicing before grinding process for highly reliable singulation of low-profile and large die sizes in advanced packages.
Document Type
Article
Source
Micro & Nano Systems Letters; 11/18/2023, Vol. 11 Issue 1, p1-7, 7p
Subject
WAFER level packaging
SURFACE contamination
BEND testing
PACKAGING
Language
ISSN
22139621
Abstract
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