학술논문
Porównanie modeli przestrzeni barw CIE CAM i CIE LAB w celu lepszej automatyzacji optycznej kontroli jakości. (Polish)
Document Type
Article
Source
Przegląd Elektrotechniczny; 2024, Vol. 2024 Issue 4, p253-256, 4p
Subject
Language
Polish
ISSN
00332097
Abstract
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