학술논문

Study on the Removal Depth of the Surface Plastic Domain of Silicon-Modified Silicon Carbide.
Document Type
Article
Source
Photonics; Jan2024, Vol. 11 Issue 1, p72, 12p
Subject
NANOINDENTATION
SILICON carbide
ATOMIC force microscopes
HARD materials
BRITTLE materials
YIELD surfaces
ELECTRON beams
Language
ISSN
23046732
Abstract
Copyright of Photonics is the property of MDPI and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)