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X-ray diffraction studies of sputtered thin films of platinum.

Document Type

Article

Author

Hecq, M.; Hecq, A.; Langford, J. I.

Source

Journal of Applied Physics; Jan1982, Vol. 53 Issue 1, p421-427, 7p

Subject

Language

ISSN

00218979

Online Access

Web of Science JCR 저널정보 Scopus Find it@PNU

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