학술논문
Characterization of defect levels in semi-insulating 6H-SiC by means of photoinduced transient spectroscopy and modulated photocurrent technique.
Document Type
Article
Author
Source
Journal of Physics: Condensed Matter; 1/28/2009, Vol. 21 Issue 4, p045801-045814, 14p
Subject
Language
ISSN
09538984