학술논문

Generation of Accurate Reference Current for Data Sensing in High-Density Memories by Averaging Multiple Pairs of Dummy Cells.
Document Type
Article
Source
IEEE Journal of Solid-State Circuits; Aug2011, Vol. 46 Issue 9, p2148-2157, 10p
Subject
ELECTRONIC amplifiers
RANDOM access memory
DETECTORS
METAL oxide semiconductor field-effect transistors
LOGIC circuits
MONTE Carlo method
SIGNAL-to-noise ratio
PERFORMANCE evaluation
Language
ISSN
00189200
Abstract
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