학술논문

Simple Modeling and Analysis of Total Ionizing Dose Effects on Radio-Frequency Low-Noise Amplifiers.
Document Type
Article
Source
Electronics (2079-9292); Apr2024, Vol. 13 Issue 8, p1445, 15p
Subject
LOW noise amplifiers
HETEROJUNCTION bipolar transistors
IMPEDANCE matching
RADIO frequency
Language
ISSN
20799292
Abstract
Copyright of Electronics (2079-9292) is the property of MDPI and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)