학술논문

A deep learning approach for quantum dots sizing from wide-angle X-ray scattering data.
Document Type
Article
Source
NPJ Computational Materials; 3/15/2024, Vol. 10 Issue 1, p1-10, 10p
Subject
DEEP learning
QUANTUM dots
X-ray scattering
SMALL-angle scattering
LEAD sulfide
TRANSMISSION electron microscopy
STRUCTURAL models
Language
ISSN
20573960
Abstract
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