학술논문

Characterization of Thin AlN/Ag/AlN-Reflector Stacks on Glass Substrates for MEMS Applications.
Document Type
Article
Source
Micro (2673-8023); Mar2024, Vol. 4 Issue 1, p142-156, 15p
Subject
MICROELECTROMECHANICAL systems
FABRICATION (Manufacturing)
OPTICAL properties
FABRY-Perot interferometers
PLASMONICS
PASSIVATION
Language
ISSN
26738023
Abstract
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