학술논문

Quantitative analysis of printed nanostructured networks using high-resolution 3D FIB-SEM nanotomography.
Document Type
Academic Journal
Author
Gabbett C; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Doolan L; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Synnatschke K; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Gambini L; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Coleman E; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Kelly AG; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Liu S; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Caffrey E; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Munuera J; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Department of Physics, Faculty of Sciences, University of Oviedo, C/ Leopoldo Calvo Sotelo, 18, 33007, Oviedo, Asturias, Spain.; Murphy C; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Sanvito S; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Jones L; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.; Coleman JN; School of Physics, CRANN and AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland. colemaj@tcd.ie.
Source
Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: PubMed not MEDLINE; MEDLINE
Subject
Language
English
Abstract
Networks of solution-processed nanomaterials are becoming increasingly important across applications in electronics, sensing and energy storage/generation. Although the physical properties of these devices are often completely dominated by network morphology, the network structure itself remains difficult to interrogate. Here, we utilise focused ion beam - scanning electron microscopy nanotomography (FIB-SEM-NT) to quantitatively characterise the morphology of printed nanostructured networks and their devices using nanometre-resolution 3D images. The influence of nanosheet/nanowire size on network structure in printed films of graphene, WS 2 and silver nanosheets (AgNSs), as well as networks of silver nanowires (AgNWs), is investigated. We present a comprehensive toolkit to extract morphological characteristics including network porosity, tortuosity, specific surface area, pore dimensions and nanosheet orientation, which we link to network resistivity. By extending this technique to interrogate the structure and interfaces within printed vertical heterostacks, we demonstrate the potential of this technique for device characterisation and optimisation.
(© 2024. The Author(s).)