학술논문
Energy distribution of recoil atoms and formation of radiation defects in silicon carbide films under proton irradiation.
Document Type
Article
Author
Source
Subject
*PROTON scattering
*SPECTRAL energy distribution
*RADIATION
*SILICON carbide thin films
*IRRADIATION
*ATOMS
*COMPLEX compounds
*SIMULATION methods & models
*NUMERICAL analysis
*POINT defects
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Language
ISSN
1063-7826
Abstract
Proton scattering in a silicon carbide film has been numerically simulated. Distribution histograms of the energy imparted to recoil atoms are obtained. Two energy ranges are considered when analyzing the histograms. In the first range of 'low' energies, individual Frenkel pairs with closely spaced components are created. In the second range, recoil atoms have energies sufficient for generating a cascade of displacements. This gives rise to microscopic regions with high density of vacancies and vacancy complexes of various kinds. [ABSTRACT FROM AUTHOR]