학술논문
Local activation energy and shape factor of current-voltage curve as investigation tools for semiconductor barrier structures.
Document Type
Article
Author
Source
Subject
*THIN films
*RECOMBINATION in semiconductors
*
Language
ISSN
0021-8979
Abstract
Presents a study which examined the modeling of the I(V,T) dependence in thin film semiconductor structures. Discussion on the use of model equations and numerical procedure; Characteristic features of the equal recombination constants; Calculation of series resistance effects.