학술논문
Methods for calculating electrostatic quantities due to a free charge in a nanoscale three-dimensional tip/base junction.
Document Type
Article
Source
Subject
*ELECTROSTATICS
*SCANNING tunneling microscopy
*
Language
ISSN
0021-8979
Abstract
Presents information on a study wherein the exact solutions for fully three-dimensional electrostatic quantities due to a free charge in a nanoscale tip/base junction, such as the scanning-tunneling microscope, are given for the problem as modeled in the prolate-spheroidal coordinate system. Methods; Results; Discussion.